Spectroscopy and Spectral Analysis, Volume. 30, Issue 3, 702(2010)
The Study of Nondestructive Defect Characterization of SiC by
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MIAO Rui-xia, ZHANG Yu-ming, TANG Xiao-yan, ZHANG Yi-men. The Study of Nondestructive Defect Characterization of SiC by[J]. Spectroscopy and Spectral Analysis, 2010, 30(3): 702
Paper Information
Received: Mar. 28, 2009
Accepted: --
Published Online: Jul. 23, 2010
The Author Email: Rui-xia MIAO (miao9508301@163.com)
CSTR:32186.14.
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