Chinese Journal of Liquid Crystals and Displays, Volume. 39, Issue 2, 248(2024)

High-resolution three-dimensional measurement system based on structured light illumination

Hao QI1,2, Jian DONG1, Nan ZHAO1, and Yi YU1,2、*
Author Affiliations
  • 1Fine Instrument and Equipment Research & Development Center,Changchun Institute of Optics,Fine Mechanics and Physics,Chinese Academy of Sciences,Changchun 130033,China
  • 2University of Chinese Academy of Sciences,Beijing 100049,China
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    References(18)

    [17] HEIKKILA J. Moment and curvature preserving technique for accurate ellipse boundary detection[C], 734-737(1998).

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    Hao QI, Jian DONG, Nan ZHAO, Yi YU. High-resolution three-dimensional measurement system based on structured light illumination[J]. Chinese Journal of Liquid Crystals and Displays, 2024, 39(2): 248

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    Paper Information

    Category: Research Articles

    Received: Apr. 12, 2023

    Accepted: --

    Published Online: Apr. 24, 2024

    The Author Email: Yi YU (13756006195@139.com)

    DOI:10.37188/CJLCD.2023-0136

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