High-resolution three-dimensional measurement system based on structured light illumination

Hao QI; Jian DONG; Nan ZHAO; Yi YU

doi:10.37188/CJLCD.2023-0136

Chinese Journal of Liquid Crystals and Displays, Volume. 39, Issue 2, 248(2024)

High-resolution three-dimensional measurement system based on structured light illumination

Hao QI^1,2, Jian DONG¹, Nan ZHAO¹, and Yi YU^1,2、*

¹Fine Instrument and Equipment Research & Development Center，Changchun Institute of Optics，Fine Mechanics and Physics，Chinese Academy of Sciences，Changchun 130033，China

²University of Chinese Academy of Sciences，Beijing 100049，China

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Figures & Tables(17)

Fig. 1. Pinhole imaging model

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Fig. 2. Telecentric lens imaging model

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Fig. 3. Vertical fringe patterns

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Fig. 4. Horizontal fringe patterns

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Fig. 5. Circle center image of projector

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Fig. 6. Photograph of hardware system

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Fig. 7. Photograph of calibration target

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Fig. 8. Photo of the object

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Fig. 9. Photo of reconstructed coin

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Fig. 10. Region of reconstructed coin

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Fig. 11. Photo of reconstructed PCB board

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Fig. 12. Region of reconstructed PCB board

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Fig. 13. 3D images of the control points in 3 different positions

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Fig. 14. Error map of the flat plane

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Table 1. Intrinsic parameters of telecentric lens and projector
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Table 1. Intrinsic parameters of telecentric lens and projector
$m$ $f$ /pixel $u_{0}$ /pixel $v_{0}$ /pixel $k_{1}$ $k_{2}$
Camera 48.10 — 1 296.1 1 023.9 $2.381 \times 10^{- 9}$ $- 8.999 \times 10^{- 16}$
Projector — 4 310.6 535.9 954.8 -0.007 4 -1.163 7

Table 2. External parameters of telecentric lens and projector
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Table 2. External parameters of telecentric lens and projector
$r_{1}$ $r_{2}$ $r_{3}$ $t_{1}$ /mm $t_{2}$ /mm $t_{3}$ /mm
Camera 0.006 7 0.006 2 -0.022 7 -17.30 -22.07 —
Projector -1.923 -1.954 0.536 4 -19.47 -16.71 242.34

Table 3. Measurement results of two diagonals on calibration board

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Table 3. Measurement results of two diagonals on calibration board

Pose No.	$\bar{A C}$	Error	$\bar{B D}$	Error
1	36.623 8	0.004 2	36.679 7	0.060 0
2	36.664 8	0.045 2	36.615 2	0.004 5
3	36.646 3	0.026 7	36.691 4	0.071 7
4	36.646 3	0.026 7	36.645 5	0.025 8
5	36.634 3	0.014 6	36.666 8	0.047 1
6	36.631 3	0.011 6	36.672 7	0.053 1
7	36.614 2	0.005 4	36.673 3	0.053 6
8	36.701 8	0.082 2	36.637 5	0.017 8
9	36.695 9	0.076 2	36.609 3	0.010 4
10	36.689 6	0.069 9	36.596 4	0.023 3
Actual	36.619 7	—	36.619 7	—
Average	36.654 8	0.035 1	36.648 8	0.029 1

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Hao QI, Jian DONG, Nan ZHAO, Yi YU. High-resolution three-dimensional measurement system based on structured light illumination[J]. Chinese Journal of Liquid Crystals and Displays, 2024, 39(2): 248

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Paper Information

Category: Research Articles

Received: Apr. 12, 2023

Accepted: --

Published Online: Apr. 24, 2024

The Author Email: Yi YU (13756006195@139.com)

DOI:10.37188/CJLCD.2023-0136

Topics

Table 1. Intrinsic parameters of telecentric lens and projector

Table 1. Intrinsic parameters of telecentric lens and projector

Table 2. External parameters of telecentric lens and projector

Table 2. External parameters of telecentric lens and projector

Table 3. Measurement results of two diagonals on calibration board

Table 3. Measurement results of two diagonals on calibration board