Photonics Research, Volume. 6, Issue 8, 768(2018)

Robust and accurate terahertz time-domain spectroscopic ellipsometry

Xuequan Chen1, Edward P. J. Parrott1, Zhe Huang2, Hau-Ping Chan3, and Emma Pickwell-MacPherson1,4、*
Author Affiliations
  • 1Department of Electronic Engineering, The Chinese University of Hong Kong, Shatin, N.T., Hong Kong, China
  • 2School of Science, Zhejiang University of Science and Technology, Hangzhou 310023, China
  • 3Department of Electronic Engineering, City University of Hong Kong, Kowloon, N.T., Hong Kong, China
  • 4Department of Physics and Astronomy, Warwick University, Coventry, UK
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    References(41)

    [3] Y. Jin, G. Kim, S. Jeon. Terahertz dielectric properties of polymers. J. Korean Phys. Soc., 49, 513-517(2006).

    [22] H. Fujiwara. Spectroscopic Ellipsometry Principles and Applications(2007).

    [28] X. Chen, E. P. J. Parrott, P. Tekavec, E. Pickwell-MacPherson. A novel method for accurate THz ellipsometry. 42nd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 1-2(2017).

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    Xuequan Chen, Edward P. J. Parrott, Zhe Huang, Hau-Ping Chan, Emma Pickwell-MacPherson, "Robust and accurate terahertz time-domain spectroscopic ellipsometry," Photonics Res. 6, 768 (2018)

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    Paper Information

    Category: Spectroscopy

    Received: Apr. 20, 2018

    Accepted: May. 21, 2018

    Published Online: Aug. 1, 2018

    The Author Email: Emma Pickwell-MacPherson (e.pickwell.97@cantab.net)

    DOI:10.1364/PRJ.6.000768

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