Fast full-color pathological imaging using Fourier ptychographic microscopy via closed-form model-based colorization

Yanqi Chen; Jiurun Chen; Zhiping Wang; Yuting Gao; Yonghong He; Yishi Shi; An Pan

doi:10.1117/1.APN.4.2.026001

Advanced Photonics Nexus, Volume. 4, Issue 2, 026001(2025)

Fast full-color pathological imaging using Fourier ptychographic microscopy via closed-form model-based colorization

Yanqi Chen^1,2、†, Jiurun Chen³, Zhiping Wang⁴, Yuting Gao^1,2, Yonghong He³, Yishi Shi², and An Pan^1,2、*

¹Chinese Academy of Sciences, Xi’an Institute of Optics and Precision Mechanics, State Key Laboratory of Transient Optics and Photonics, Xi’an, China

²University of Chinese Academy of Sciences, School of Optoelectronics, Beijing, China

³Tsinghua University, Tsinghua Shenzhen International Graduate School, Shenzhen, China

⁴Biozentrum, University of Basel, Basel, Switzerland

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Yanqi Chen, Jiurun Chen, Zhiping Wang, Yuting Gao, Yonghong He, Yishi Shi, An Pan, "Fast full-color pathological imaging using Fourier ptychographic microscopy via closed-form model-based colorization," Adv. Photon. Nexus 4, 026001 (2025)

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Paper Information

Category: Research Articles

Received: Oct. 25, 2024

Accepted: Jan. 14, 2025

Published Online: Mar. 21, 2025

The Author Email: An Pan (panan@opt.cn)

DOI:10.1117/1.APN.4.2.026001

CSTR:32397.14.1.APN.4.2.026001

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