Acta Optica Sinica, Volume. 38, Issue 7, 0712003(2018)
Detection and Evaluation of Surface Defects Based on Critical Frequency Method by Laser Ultrasonic
Fig. 7. B-scanning images of surface defect. (a) Defect depth of 0.40 mm; (b) defect depth of 0.30 mm; (c) defect depth of 0.20 mm; (d) defect depth of 0.10 mm; (e) defect depth of 0.08 mm
Fig. 8. Frequency spectrum energy diagrams of reflection/transmission signals. (a) Defect depth of 0.40 mm; (b) defect depth of 0.30 mm; (c) defect depth of 0.20 mm; (d) defect depth of 0.10 mm; (e) defect depth of 0.08 mm (red solid lines and blue solid lines represent curves of transmission surface wave and defect reflection surface wave, respectively)
Fig. 10. B-scanning images at different distances between excitation point and detection point
Fig. 11. Frequency spectrum energy diagrams of reflection/transmission signal when distance between excitation point and detection point is different. (a) Distance of 5 mm; (b) distance of 10 mm ; (c) distance of 15 mm; (d) distance of 20 mm; (e) distance is of 25 mm (the red solid lines and blue solid lines represent curves of transmission surface wave and defect reflection surface wave, respectively)
Fig. 13. Frequency spectrum energy diagrams of reflection/transmission signals of samples with different materials. (a) Aluminum; (b) steel (the red solid lines and blue solid lines represent curves of transmission surface wave and defect reflection surface wave, respectively)
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Haiyang Li, Qiaoxia Li, Zhaoba Wang, Qianghua Pan. Detection and Evaluation of Surface Defects Based on Critical Frequency Method by Laser Ultrasonic[J]. Acta Optica Sinica, 2018, 38(7): 0712003
Category: Instrumentation, Measurement and Metrology
Received: Dec. 5, 2017
Accepted: --
Published Online: Sep. 5, 2018
The Author Email: Li Haiyang (climb021@163.com)