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Acta Optica Sinica, Volume. 38, Issue 7, 0712003(2018)

Detection and Evaluation of Surface Defects Based on Critical Frequency Method by Laser Ultrasonic

Haiyang Li1、*, Qiaoxia Li1, Zhaoba Wang1, and Qianghua Pan2
Author Affiliations
  • 1 School of Information and Communication Engineering, North University of China, Taiyuan, Shanxi 0 30051, China
  • 2 China Special Equipment and Research Institute, Beijing 100029, China
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    Article index updated: Mar. 10, 2025

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    Haiyang Li, Qiaoxia Li, Zhaoba Wang, Qianghua Pan. Detection and Evaluation of Surface Defects Based on Critical Frequency Method by Laser Ultrasonic[J]. Acta Optica Sinica, 2018, 38(7): 0712003

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Dec. 5, 2017

    Accepted: --

    Published Online: Sep. 5, 2018

    The Author Email: Li Haiyang (climb021@163.com)

    DOI:10.3788/AOS201838.0712003

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology