[1] [1] S. Jacobi, B. Steeg, J. Wiesmann, M. Stormer, J. Feldhaus, R. Bormann, and C. Michaelsen, Proc. SPIE 4782, 113 (2002).

[2] [2] http://www-cxro.lbl.gov/als6.3.2/.

[3] [3] F. M. d'Heurle, Metall. Teans. 1, 725 (1970).

[4] [4] F. M. d'Heurle and J. M. E. Harper, Thin Solid Films 171, 81 (1989).

[5] [5] H. Windischmann, J. Appl. Phys. 62, 1800 (1987).

[6] [6] C. A. Davis, Thin Solid Films 226, 30 (1993).

[7] [7] E. Mounier and Y. Pauleau, J. Vac. Sci. Technol. A 14, 2535 (1996).

[8] [8] F. Wang, Z. Wang, J. Zhu, Z. Zhang, W. Wu, S. Zhang, and L. Chen, Chin. Opt. Lett. 4, 550 (2006).

[9] [9] Z. Wang, S. Zhang, W. Wu, J. Zhu, H. Wang, C. Li, Y. Xu, F. Wang, Z. Zhang, L. Chen, H. Zhou, and T. Huo, Chin. Opt. Lett. 4, 611 (2006).

[10] [10] E. Mounier and Y. Pauleau, Diamond. Relat. Mater. 6, 1182 (1997).

[11] [11] D. L. Windt, Computers in Physics 12, 360 (1998).

[12] [12] D. Henderson, M. H. Brodsky, and P. Chaudhari, Appl. Phys. Lett. 25, 641 (1974).

[13] [13] O. Durand-Drouhin and M. Benlahsen, Solid State Commun. 131, 425 (2004).