Chinese Journal of Lasers, Volume. 44, Issue 1, 102016(2017)

Dicing of Sapphire Wafer with All-Fiber Picosecond Laser

Hu Xiaobao1、*, Hao Qiang1, Guo Zhengru1, and Zeng Heping1,2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    References(18)

    [3] Gao Huiying[J]. The trends and the state of China's LED substrate Equipment for Electronic Products Manufacturing, 2011, 1-6.

    [9] Migliore L. Enhancing silicon cutting performance by shaping the focused beam[C]. SPIE, 6458, 64580W(2007).

    [17] Ohmura E, Kawahito Y, Fukumitsu K et al. Analysis of internal crack propagation in silicon due to permeable pulse laser irradiation: study on processing mechanism of stealth dicing[C]. SPIE, 7996, 799603(2010).

    [18] Kumagai M, Uchiyama N, Ohmura E et al. Advanced dicing technology for semiconductor wafer-stealth dicing[C]. IEEE International Symposium on Semiconductor Manufacturing, 215-218(2006).

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    Hu Xiaobao, Hao Qiang, Guo Zhengru, Zeng Heping. Dicing of Sapphire Wafer with All-Fiber Picosecond Laser[J]. Chinese Journal of Lasers, 2017, 44(1): 102016

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    Paper Information

    Special Issue:

    Received: Jun. 24, 2016

    Accepted: --

    Published Online: Jan. 10, 2017

    The Author Email: Xiaobao Hu (xiaobao_hu@foxmail.com)

    DOI:10.3788/CJL201744.0102016

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