Chinese Journal of Lasers, Volume. 44, Issue 1, 102016(2017)
Dicing of Sapphire Wafer with All-Fiber Picosecond Laser
[3] Gao Huiying[J]. The trends and the state of China's LED substrate Equipment for Electronic Products Manufacturing, 2011, 1-6.
[9] Migliore L. Enhancing silicon cutting performance by shaping the focused beam[C]. SPIE, 6458, 64580W(2007).
[17] Ohmura E, Kawahito Y, Fukumitsu K et al. Analysis of internal crack propagation in silicon due to permeable pulse laser irradiation: study on processing mechanism of stealth dicing[C]. SPIE, 7996, 799603(2010).
[18] Kumagai M, Uchiyama N, Ohmura E et al. Advanced dicing technology for semiconductor wafer-stealth dicing[C]. IEEE International Symposium on Semiconductor Manufacturing, 215-218(2006).
Get Citation
Copy Citation Text
Hu Xiaobao, Hao Qiang, Guo Zhengru, Zeng Heping. Dicing of Sapphire Wafer with All-Fiber Picosecond Laser[J]. Chinese Journal of Lasers, 2017, 44(1): 102016
Special Issue:
Received: Jun. 24, 2016
Accepted: --
Published Online: Jan. 10, 2017
The Author Email: Xiaobao Hu (xiaobao_hu@foxmail.com)