Researching | Hard X-ray resonant reflectivity studies of ultrathin WS2 layers grown by pulsed laser deposition

Journal of Semiconductors, Volume. 46, Issue 3, 032701(2025)

Hard X-ray resonant reflectivity studies of ultrathin WS₂ layers grown by pulsed laser deposition

Sergey M. Suturin^1、*, Polina A. Dvortsova¹, Alexander M. Korovin¹, Vladimir V. Fedorov², Evgeniya Yu. Lobanova¹, and Nikolai S. Sokolov¹

Author Affiliations

¹ITMO University, 49 Kronverksky prospekt, 197101 St. Petersburg, Russia

²Alferov University, 8/3 Khlopina, 194021 St. Petersburg, Russia

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Sergey M. Suturin, Polina A. Dvortsova, Alexander M. Korovin, Vladimir V. Fedorov, Evgeniya Yu. Lobanova, Nikolai S. Sokolov. Hard X-ray resonant reflectivity studies of ultrathin WS₂ layers grown by pulsed laser deposition[J]. Journal of Semiconductors, 2025, 46(3): 032701

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Paper Information

Category: Research Articles

Received: Aug. 26, 2024

Accepted: --

Published Online: Apr. 27, 2025

The Author Email: Sergey M. Suturin (SMSuturin)

DOI:10.1088/1674-4926/24080040

Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology