Laser & Optoelectronics Progress, Volume. 61, Issue 21, 2130002(2024)
Inspection and Identification of Blades Using X-Ray Fluorescence Spectroscopy Combined with Random Forest
Tao Zhang1, Chunyu Li1、*, Hong Jiang2, Zhuo Yang1, Hongli Tian3, Xiaojing Liu3, and Wei Han3
Author Affiliations
1Institite of Criminal Investigation, People's Public Security University of China, Beijing 100038, China2Criminal Investigation Department, Gansu Police Vocational College, Lanzhou , 730046, Gansu , China3Beijing Ancoren Technology Co., Ltd., Beijing 101102, Chinashow less