Inspection and Identification of Blades Using X-Ray Fluorescence Spectroscopy Combined with Random Forest

Tao Zhang; Chunyu Li; Hong Jiang; Zhuo Yang; Hongli Tian; Xiaojing Liu; Wei Han

doi:10.3788/LOP240675

Laser & Optoelectronics Progress, Volume. 61, Issue 21, 2130002(2024)

Inspection and Identification of Blades Using X-Ray Fluorescence Spectroscopy Combined with Random Forest

Tao Zhang¹, Chunyu Li^1、*, Hong Jiang², Zhuo Yang¹, Hongli Tian³, Xiaojing Liu³, and Wei Han³

Author Affiliations

¹Institite of Criminal Investigation, People's Public Security University of China, Beijing 100038, China

²Criminal Investigation Department, Gansu Police Vocational College, Lanzhou , 730046, Gansu , China

³Beijing Ancoren Technology Co., Ltd., Beijing 101102, China

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Tao Zhang, Chunyu Li, Hong Jiang, Zhuo Yang, Hongli Tian, Xiaojing Liu, Wei Han. Inspection and Identification of Blades Using X-Ray Fluorescence Spectroscopy Combined with Random Forest[J]. Laser & Optoelectronics Progress, 2024, 61(21): 2130002

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Paper Information

Category: Spectroscopy

Received: Feb. 5, 2024

Accepted: Mar. 22, 2024

Published Online: Nov. 11, 2024

The Author Email: Chunyu Li (lichunyu@ppsuc.edu.cn)

DOI:10.3788/LOP240675

CSTR:32186.14.LOP240675

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology