Laser & Optoelectronics Progress, Volume. 60, Issue 20, 2018001(2023)

Fourier Ptychography Microscopy Based on Super-Resolution Adversarial Network

Yi Wang1,2, Xiaoyu Wei1、*, Baohui Liu1, and Hao Su1,3
Author Affiliations
  • 1College of Electrical Engineering, North China University of Science and Technology, Tangshan 063210, Hebei , China
  • 2Tangshan Technology Innovation Center of Intellectualisation of Metal Component Production Line, Tangshan 063210, Hebei , China
  • 3Tangshan Key Laboratory of Semiconductor Integrated Circuits, Tangshan 063210, Hebei , China
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    Yi Wang, Xiaoyu Wei, Baohui Liu, Hao Su. Fourier Ptychography Microscopy Based on Super-Resolution Adversarial Network[J]. Laser & Optoelectronics Progress, 2023, 60(20): 2018001

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    Paper Information

    Category: Microscopy

    Received: Oct. 26, 2022

    Accepted: Dec. 23, 2022

    Published Online: Oct. 13, 2023

    The Author Email: Xiaoyu Wei (1347870676@qq.com)

    DOI:10.3788/LOP222900

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