Researching | Fourier Ptychography Microscopy Based on Super-Resolution Adversarial Network

Laser & Optoelectronics Progress, Volume. 60, Issue 20, 2018001(2023)

Fourier Ptychography Microscopy Based on Super-Resolution Adversarial Network

Yi Wang^1,2, Xiaoyu Wei^1、*, Baohui Liu¹, and Hao Su^1,3

Author Affiliations

¹College of Electrical Engineering, North China University of Science and Technology, Tangshan 063210, Hebei , China

²Tangshan Technology Innovation Center of Intellectualisation of Metal Component Production Line, Tangshan 063210, Hebei , China

³Tangshan Key Laboratory of Semiconductor Integrated Circuits, Tangshan 063210, Hebei , China

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Yi Wang, Xiaoyu Wei, Baohui Liu, Hao Su. Fourier Ptychography Microscopy Based on Super-Resolution Adversarial Network[J]. Laser & Optoelectronics Progress, 2023, 60(20): 2018001

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Paper Information

Category: Microscopy

Received: Oct. 26, 2022

Accepted: Dec. 23, 2022

Published Online: Oct. 13, 2023

The Author Email: Wei Xiaoyu (1347870676@qq.com)

DOI:10.3788/LOP222900

Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology