Chinese Optics Letters, Volume. 7, Issue 2, 02162(2009)
Influences of Y2O3 dopant content on residual stress, structure, and optical properties of ZrO2 thin films
[1] [1] M. G. Krishna, K. N. Rao, and S. Mohan, J. Vac. Sci. Technol. A 10, 3451 (1992).
[3] [3] G. Laukaitis, J. Dudonis, and D. Milcius, Thin Solid Films 515, 678 (2006).
[4] [4] W. T. Pawlewicz and D. D. Hays, Thin Solid Films 94, 31 (1982).
[5] [5] J. T. Chang, C. H. Yeh, J. L. He, K. C. Chen, A. Matthews, and A. Leyland, Surf. Coat. Technol. 200, 1401 (2005).
[6] [6] S. Sprio, S. Guicciardi, A. Bellosi, and G. Pezzotti, Surf. Coat. Technol. 200, 4579 (2006).
[7] [7] M. Fukutomi, S. Aoki, K. Komori, Y. Tanaka, T. Asano, and H. Maeda, Thin Solid Films 239, 123 (1994).
[8] [8] S. Wu, J. Shao, K. Yi, and Z. Fan, "Y2O3 stabilized ZrO2 vacuum coating material and its preparation" (in Chinese) Chinese Patent CN1696328 (2005).
[9] [9] P. Gao, L. J. Meng, M. P. dos Santos, V. Teixeira, and M. Andritschky, Thin Solid Films 377, 557 (2000).
[10] [10] J. C. Manifacier, J. Gasiot, and J. P. Fillard, J. Phys. E 9, 1002 (1976).
[11] [11] M. Boulouz, L. Martin, A. Boulouz, and A. Boyer, Mater. Sci. Eng. B 67, 122 (1999).
[12] [12] M. Harris, H. A. Macleod, S. Ogura, E. Pelletier, and B. Vidal, Thin Solid Films 57, 173 (1979).
[13] [13] J. Tang, P. Gu, X. Liu, and H. Li, Modern Optical Thin Films Technology (Zhejiang University Press, Hangzhou, 2006) p.244.
[14] [14] J. Ullmann, A. J. Kellock, and J. E. E. Baglin, Thin Solid Films 341, 238 (1999).
[15] [15] E. Klockholm, J. Vac. Sci. Technol. 6, 138 (1968).
Get Citation
Copy Citation Text
Qiling Xiao, Shuying Shao, Jianda Shao, Zhengxiu Fan, "Influences of Y2O3 dopant content on residual stress, structure, and optical properties of ZrO2 thin films," Chin. Opt. Lett. 7, 02162 (2009)
Received: Apr. 8, 2008
Accepted: --
Published Online: Feb. 23, 2009
The Author Email: