Global Curve Fitting for Structured Illumination Microscopy with High Thickness Detection Resolution

Kejun Yang; Chenhaolei Han; Lei Liu; Jinhua Feng; Zhongye Xie; Song Hu; Yan Tang

doi:10.3788/AOS202242.2012001

Acta Optica Sinica, Volume. 42, Issue 20, 2012001(2022)

Global Curve Fitting for Structured Illumination Microscopy with High Thickness Detection Resolution

Kejun Yang^1,2, Chenhaolei Han^1,2, Lei Liu^1,2, Jinhua Feng¹, Zhongye Xie³, Song Hu¹, and Yan Tang^1、*

¹State Key Lab of Optical Technologies on Nano-Fabrication and Micro-Engineering, Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, Sichuan , China

²University of Chinese Academy of Sciences, Beijing 100049, China

³School of Electrical Engineering & Intelligentization, Dongguan University of Technology, Dongguan 523808, Guangdong , China

show less

Abstract Get PDF(in Chinese)

Cited By

Article index updated: Mar. 10, 2025

The article is cited by 1 article(s) CLP online library. (Some content might be in Chinese.)

Tools

Get Citation

Copy Citation Text

Kejun Yang, Chenhaolei Han, Lei Liu, Jinhua Feng, Zhongye Xie, Song Hu, Yan Tang. Global Curve Fitting for Structured Illumination Microscopy with High Thickness Detection Resolution[J]. Acta Optica Sinica, 2022, 42(20): 2012001

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: Instrumentation, Measurement and Metrology

Received: Feb. 22, 2022

Accepted: Apr. 24, 2022

Published Online: Oct. 18, 2022

The Author Email: Tang Yan (tangyan@ioe.ac.cn)

DOI:10.3788/AOS202242.2012001

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology