Self-Collimation Inspection and Focusing Method Based on Image Processing

Li Qihui; Ding Yalin; Xiu Jihong; Liu Chongyang; Cai Yiming; Liao Jinfeng

doi:10.3788/LOP57.021104

Laser & Optoelectronics Progress, Volume. 57, Issue 2, 21104(2020)

Self-Collimation Inspection and Focusing Method Based on Image Processing

Li Qihui^1,2, Ding Yalin^1、*, Xiu Jihong¹, Liu Chongyang^1,2, Cai Yiming^1,2, and Liao Jinfeng^1,2

¹Key Laboratory of Airborne Optical Image and Measurement, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China

²University of Chinese Academy of Science, Beijing 100049, China

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Figures & Tables(7)

Fig. 1. Schematic of ideal imaging system

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Fig. 2. Relationship between light intensity and defocusing distance

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Fig. 3. Schematic of image auto-collimation inspection and focusing system

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Fig. 4. Schematics of targets. (a) Grating target; (b) radial target

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Fig. 5. Defocus diagrams of radial and grating targets. (a) 26th image; (b) 38th image; (c) 51st image

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Fig. 6. Normalized eigenvalue curves of the defocus image. (a) Lena; (b) grating; (c) radiation; (d) contrast of three targets

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Table 1. Comparative analysis of inspection and focusing results
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Table 1. Comparative analysis of inspection and focusing results
Parameter Sobel Laplacian Sq-Grad
Radiation Grating Lena Radiation Grating Lena Radiation Grating Lena
w₁_/₂ 20 26 14 20 18 10 20 28
T 0.9291 0.0065 0.3475 0.9858 0.7608 0.8035 1 0.8297 0.4806

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Li Qihui, Ding Yalin, Xiu Jihong, Liu Chongyang, Cai Yiming, Liao Jinfeng. Self-Collimation Inspection and Focusing Method Based on Image Processing[J]. Laser & Optoelectronics Progress, 2020, 57(2): 21104

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