Self-Collimation Inspection and Focusing Method Based on Image Processing

Li Qihui; Ding Yalin; Xiu Jihong; Liu Chongyang; Cai Yiming; Liao Jinfeng

doi:10.3788/LOP57.021104

Laser & Optoelectronics Progress, Volume. 57, Issue 2, 21104(2020)

Self-Collimation Inspection and Focusing Method Based on Image Processing

Li Qihui^1,2, Ding Yalin^1、*, Xiu Jihong¹, Liu Chongyang^1,2, Cai Yiming^1,2, and Liao Jinfeng^1,2

¹Key Laboratory of Airborne Optical Image and Measurement, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China

²University of Chinese Academy of Science, Beijing 100049, China

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Li Qihui, Ding Yalin, Xiu Jihong, Liu Chongyang, Cai Yiming, Liao Jinfeng. Self-Collimation Inspection and Focusing Method Based on Image Processing[J]. Laser & Optoelectronics Progress, 2020, 57(2): 21104

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Paper Information

Category: Imaging Systems

Received: Jun. 11, 2019

Accepted: --

Published Online: Jan. 3, 2020

The Author Email: Ding Yalin (dingyl_1964@126.com)

DOI:10.3788/LOP57.021104

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology