Laser & Optoelectronics Progress, Volume. 57, Issue 3, 031202(2020)
Intensity Consistency Control Method for Multi-Wavelength Micro-Interferometry
Fig. 8. Interferograms before and after intensity control. (a)(d) 510 nm interferograms before and after intensity control; (b)(e) 540 nm interferograms before and after intensity control; (c)(f) 640 nm interferograms before and after intensity control
Fig. 9. Vertical grayscale projections before and after intensity control. (a) Before intensity control; (b) after intensity control
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Zhongsheng Zhai, Jiaojie Huang, Hang Zhao, Jinsong Li, Qinghua Lü, Xuanze Wang. Intensity Consistency Control Method for Multi-Wavelength Micro-Interferometry[J]. Laser & Optoelectronics Progress, 2020, 57(3): 031202
Category: Instrumentation, Measurement and Metrology
Received: Jun. 13, 2019
Accepted: Jul. 27, 2019
Published Online: Feb. 17, 2020
The Author Email: Zhongsheng Zhai (supersakula@163.com)