Laser & Optoelectronics Progress, Volume. 57, Issue 3, 031202(2020)

Intensity Consistency Control Method for Multi-Wavelength Micro-Interferometry

Zhongsheng Zhai1、*, Jiaojie Huang1, Hang Zhao1, Jinsong Li1, Qinghua Lü2, and Xuanze Wang1
Author Affiliations
  • 1Hubei Key Laboratory of Modern Manufacturing Quantity Engineering, School of Mechanical Engineering, Hubei University of Technology, Wuhan, Hubei 430068, China
  • 2School of Science, Hubei University of Technology, Wuhan, Hubei 430068, China
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    Figures & Tables(11)
    Schematic diagram of light intensity consistency interferometry system
    Spectral characteristic curve of white light source
    System control block diagram
    LED driving circuit
    Diagram of light intensity dynamic curve during switching process
    System step response
    Illuminance dynamic curve during wavelength rotation
    Interferograms before and after intensity control. (a)(d) 510 nm interferograms before and after intensity control; (b)(e) 540 nm interferograms before and after intensity control; (c)(f) 640 nm interferograms before and after intensity control
    Vertical grayscale projections before and after intensity control. (a) Before intensity control; (b) after intensity control
    • Table 1. Light intensity adjustment schedule

      View table

      Table 1. Light intensity adjustment schedule

      Serial numbert2 /st3 /s
      12.361.62
      22.221.62
      32.301.76
      42.201.62
      52.241.70
    • Table 2. Visibility of three-wavelength interference image

      View table

      Table 2. Visibility of three-wavelength interference image

      Wavelength /nmBefore intensity controlAfter intensity control
      Maximumgray valueMinimumgray valueKMaximumgray valueMinimumgray valueK
      5102407745480.68986029190.54
      5407233890200.781034529290.56
      6401199630170.601036030270.55
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    Zhongsheng Zhai, Jiaojie Huang, Hang Zhao, Jinsong Li, Qinghua Lü, Xuanze Wang. Intensity Consistency Control Method for Multi-Wavelength Micro-Interferometry[J]. Laser & Optoelectronics Progress, 2020, 57(3): 031202

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jun. 13, 2019

    Accepted: Jul. 27, 2019

    Published Online: Feb. 17, 2020

    The Author Email: Zhongsheng Zhai (supersakula@163.com)

    DOI:10.3788/LOP57.031202

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