Intensity Consistency Control Method for Multi-Wavelength Micro-Interferometry

Zhongsheng Zhai; Jiaojie Huang; Hang Zhao; Jinsong Li; Qinghua Lü; Xuanze Wang

doi:10.3788/LOP57.031202

Laser & Optoelectronics Progress, Volume. 57, Issue 3, 031202(2020)

Intensity Consistency Control Method for Multi-Wavelength Micro-Interferometry

Zhongsheng Zhai^1、*, Jiaojie Huang¹, Hang Zhao¹, Jinsong Li¹, Qinghua Lü², and Xuanze Wang¹

¹Hubei Key Laboratory of Modern Manufacturing Quantity Engineering, School of Mechanical Engineering, Hubei University of Technology, Wuhan, Hubei 430068, China

²School of Science, Hubei University of Technology, Wuhan, Hubei 430068, China

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Zhongsheng Zhai, Jiaojie Huang, Hang Zhao, Jinsong Li, Qinghua Lü, Xuanze Wang. Intensity Consistency Control Method for Multi-Wavelength Micro-Interferometry[J]. Laser & Optoelectronics Progress, 2020, 57(3): 031202

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Paper Information

Category: Instrumentation, Measurement and Metrology

Received: Jun. 13, 2019

Accepted: Jul. 27, 2019

Published Online: Feb. 17, 2020

The Author Email: Zhongsheng Zhai (supersakula@163.com)

DOI:10.3788/LOP57.031202

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology