Off-Axis Point Wave Aberration Testing for Imaging Lens Based on Phase Measuring Deflectometry

Yilang Ruan; Dahai Li; Linzhi Yu; Xinwei Zhang; Xiangtian Xiao

doi:10.3788/CJL202249.2104003

Chinese Journal of Lasers, Volume. 49, Issue 21, 2104003(2022)

Off-Axis Point Wave Aberration Testing for Imaging Lens Based on Phase Measuring Deflectometry

Yilang Ruan¹, Dahai Li^1,2、*, Linzhi Yu¹, Xinwei Zhang¹, and Xiangtian Xiao¹

Author Affiliations

¹College of Electronics and Information Engineering, Sichuan University, Chengdu 610065, Sichuan, China

²School of Aeronautics and Astronautics, Sichuan University, Chengdu 610065, Sichuan, China

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Yilang Ruan, Dahai Li, Linzhi Yu, Xinwei Zhang, Xiangtian Xiao. Off-Axis Point Wave Aberration Testing for Imaging Lens Based on Phase Measuring Deflectometry[J]. Chinese Journal of Lasers, 2022, 49(21): 2104003

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Paper Information

Category: Measurement and metrology

Received: Jan. 14, 2022

Accepted: Mar. 3, 2022

Published Online: Oct. 14, 2022

The Author Email: Li Dahai (lidahai@scu.edu.cn)

DOI:10.3788/CJL202249.2104003

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology