Source Blur Elimination in Micro-CT Using Self-Attention-Based U-Net

Chuanjiang Liu; Ao Wang; Genyuan Zhang; Wei Yuan; Fenglin Liu

doi:10.3788/AOS231855

Acta Optica Sinica, Volume. 44, Issue 7, 0734002(2024)

Source Blur Elimination in Micro-CT Using Self-Attention-Based U-Net

Chuanjiang Liu^1,2, Ao Wang², Genyuan Zhang², Wei Yuan², and Fenglin Liu^1,2、*

Author Affiliations

¹College of Mechanical and Vehicle Engineering, Chongqing University, Chongqing 400044, China

²Engineering Research Center of Industrial Computed Tomography Non-Destructive Testing, Ministry of Education, Chongqing University, Chongqing 400044, China

show less

Abstract Get PDF(in Chinese)

Cited By

Article index updated: Mar. 10, 2025

The article is cited by 1 article(s) CLP online library. (Some content might be in Chinese.)

Tools

Get Citation

Copy Citation Text

Chuanjiang Liu, Ao Wang, Genyuan Zhang, Wei Yuan, Fenglin Liu. Source Blur Elimination in Micro-CT Using Self-Attention-Based U-Net[J]. Acta Optica Sinica, 2024, 44(7): 0734002

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: X-Ray Optics

Received: Nov. 29, 2023

Accepted: Jan. 25, 2024

Published Online: Apr. 11, 2024

The Author Email: Liu Fenglin (liufl@cqu.edu.cn)

DOI:10.3788/AOS231855

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology