Acta Optica Sinica, Volume. 41, Issue 22, 2212001(2021)
High-Resolution Echelle Grating Spectrometer Based on Off-Axis Three-Mirror Reflective Optical System
Fig. 4. Relationship between wavelength and order within a specific diffraction angle range. (a) Short wave band; (b) long wave band
Fig. 6. Relationship between deflection angle and prism vertex angle and light incident angle
Fig. 8. Spot diagrams of system. (a) 402.31 nm and 402.313 nm; (b) 541.82 nm and 541.824 nm; (c) 870.475 nm and 870.48 nm
Fig. 9. Aberration of system. (a) 402.31 nm and 402.313 nm; (b) 541.82 nm and 541.824 nm; (c) 870.475 nm and 870.48 nm
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Zengpeng Yang, Zhengyan Li, Enchang Pu, Lisong Yan, Chenyue Wang, Lüji Chen, Ping Li, Weiping Yang, Yang Zhang. High-Resolution Echelle Grating Spectrometer Based on Off-Axis Three-Mirror Reflective Optical System[J]. Acta Optica Sinica, 2021, 41(22): 2212001
Category: Instrumentation, Measurement and Metrology
Received: Apr. 23, 2021
Accepted: Jun. 3, 2021
Published Online: Nov. 17, 2021
The Author Email: Zengpeng Yang (175367864@qq.com)