Acta Optica Sinica, Volume. 41, Issue 22, 2212001(2021)

High-Resolution Echelle Grating Spectrometer Based on Off-Axis Three-Mirror Reflective Optical System

Zengpeng Yang1,2、*, Zhengyan Li2, Enchang Pu1, Lisong Yan2, Chenyue Wang1, Lüji Chen1, Ping Li1, Weiping Yang3, and Yang Zhang3
Author Affiliations
  • 1Kunming Institute of Physics, Kunming, Yunnan 650223, China
  • 2School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, Hubei 430074, China
  • 3School of Physics and Electronic Information Technology, Yunnan Normal University, Kunming, Yunnan 650500, China
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    Figures & Tables(12)
    Basic optical path of the echelle grating spectrometer
    Relationship between grating angular dispersion rate and m, ν and θm
    Angular dispersion rate of the grating when θm=63°
    Relationship between wavelength and order within a specific diffraction angle range. (a) Short wave band; (b) long wave band
    Optical path of the reflecting prism
    Relationship between deflection angle and prism vertex angle and light incident angle
    Optical path structure of the spectrometer
    Spot diagrams of system. (a) 402.31 nm and 402.313 nm; (b) 541.82 nm and 541.824 nm; (c) 870.475 nm and 870.48 nm
    Aberration of system. (a) 402.31 nm and 402.313 nm; (b) 541.82 nm and 541.824 nm; (c) 870.475 nm and 870.48 nm
    Two-dimensional dispersion spectrum
    • Table 1. Performance index of the spectrometer

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      Table 1. Performance index of the spectrometer

      ParameterValue
      Pinhole /μm10
      Spectral range /nm400--900
      F number4.5
      Spectral resolution0.0049 nm@(510--540 nm)
    • Table 2. Calculation constants of K9 glass

      View table

      Table 2. Calculation constants of K9 glass

      ParameterValueParameterValue
      K15.67853792×10-1L12.38581579×10-3
      K27.02269689×10-1L21.35348332×10-2
      K31.08102455L31.07748228×102
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    Zengpeng Yang, Zhengyan Li, Enchang Pu, Lisong Yan, Chenyue Wang, Lüji Chen, Ping Li, Weiping Yang, Yang Zhang. High-Resolution Echelle Grating Spectrometer Based on Off-Axis Three-Mirror Reflective Optical System[J]. Acta Optica Sinica, 2021, 41(22): 2212001

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Apr. 23, 2021

    Accepted: Jun. 3, 2021

    Published Online: Nov. 17, 2021

    The Author Email: Zengpeng Yang (175367864@qq.com)

    DOI:10.3788/AOS202141.2212001

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