High-Resolution Echelle Grating Spectrometer Based on Off-Axis Three-Mirror Reflective Optical System

Zengpeng Yang; Zhengyan Li; Enchang Pu; Lisong Yan; Chenyue Wang; Lüji Chen; Ping Li; Weiping Yang; Yang Zhang

doi:10.3788/AOS202141.2212001

Acta Optica Sinica, Volume. 41, Issue 22, 2212001(2021)

High-Resolution Echelle Grating Spectrometer Based on Off-Axis Three-Mirror Reflective Optical System

Zengpeng Yang^1,2、*, Zhengyan Li², Enchang Pu¹, Lisong Yan², Chenyue Wang¹, Lüji Chen¹, Ping Li¹, Weiping Yang³, and Yang Zhang³

Author Affiliations

¹Kunming Institute of Physics, Kunming, Yunnan 650223, China

²School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, Hubei 430074, China

³School of Physics and Electronic Information Technology, Yunnan Normal University, Kunming, Yunnan 650500, China

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Zengpeng Yang, Zhengyan Li, Enchang Pu, Lisong Yan, Chenyue Wang, Lüji Chen, Ping Li, Weiping Yang, Yang Zhang. High-Resolution Echelle Grating Spectrometer Based on Off-Axis Three-Mirror Reflective Optical System[J]. Acta Optica Sinica, 2021, 41(22): 2212001

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Paper Information

Category: Instrumentation, Measurement and Metrology

Received: Apr. 23, 2021

Accepted: Jun. 3, 2021

Published Online: Nov. 17, 2021

The Author Email: Zengpeng Yang (175367864@qq.com)

DOI:10.3788/AOS202141.2212001

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology