Acta Optica Sinica, Volume. 41, Issue 22, 2212001(2021)

High-Resolution Echelle Grating Spectrometer Based on Off-Axis Three-Mirror Reflective Optical System

Zengpeng Yang1,2、*, Zhengyan Li2, Enchang Pu1, Lisong Yan2, Chenyue Wang1, Lüji Chen1, Ping Li1, Weiping Yang3, and Yang Zhang3
Author Affiliations
  • 1Kunming Institute of Physics, Kunming, Yunnan 650223, China
  • 2School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan, Hubei 430074, China
  • 3School of Physics and Electronic Information Technology, Yunnan Normal University, Kunming, Yunnan 650500, China
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    Zengpeng Yang, Zhengyan Li, Enchang Pu, Lisong Yan, Chenyue Wang, Lüji Chen, Ping Li, Weiping Yang, Yang Zhang. High-Resolution Echelle Grating Spectrometer Based on Off-Axis Three-Mirror Reflective Optical System[J]. Acta Optica Sinica, 2021, 41(22): 2212001

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Apr. 23, 2021

    Accepted: Jun. 3, 2021

    Published Online: Nov. 17, 2021

    The Author Email: Zengpeng Yang (175367864@qq.com)

    DOI:10.3788/AOS202141.2212001

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