Application of Quantitative Phase Imaging in Ultrafast Laser Processing Inspection

Changheng Li; Shengwei Cui; X. Steve Yao

doi:10.3788/CJL221494

Chinese Journal of Lasers, Volume. 50, Issue 12, 1202403(2023)

Application of Quantitative Phase Imaging in Ultrafast Laser Processing Inspection

Changheng Li^1,2, Shengwei Cui^1,2、*, and X. Steve Yao^1,2

¹Photonics Information Innovation Center, College of Physics and Technology, Hebei University, Baoding 071002, Hebei, China

²Hebei Provincial Center for Optical Sensing Innovations, Baoding 071002, Hebei, China

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Changheng Li, Shengwei Cui, X. Steve Yao. Application of Quantitative Phase Imaging in Ultrafast Laser Processing Inspection[J]. Chinese Journal of Lasers, 2023, 50(12): 1202403

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Paper Information

Category: Laser Micro-Nano Manufacturing

Received: Dec. 5, 2022

Accepted: Feb. 13, 2023

Published Online: Jun. 6, 2023

The Author Email: Cui Shengwei (shengwei@hbu.edu.cn)

DOI:10.3788/CJL221494

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology