AEROSPACE SHANGHAI, Volume. 42, Issue 4, 103(2025)

Electromagnetic Unlocking Reliability Analysis of Separation Electrical Connectors Based on Digital Models

Xuerong YE, Shanxue ZHAO, and Hao CHEN
Author Affiliations
  • School of Electrical Engineering and Automation,Harbin Institute of Technology,Harbin150001,,China
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    [11] W H CHEN, J CUI, J PAN et al. Rliability testand statistical analysis of electrical connector under vibration stress. Acta Aeronautica et Astronautica Sinica, 24, 342-345(2003).

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    Xuerong YE, Shanxue ZHAO, Hao CHEN. Electromagnetic Unlocking Reliability Analysis of Separation Electrical Connectors Based on Digital Models[J]. AEROSPACE SHANGHAI, 2025, 42(4): 103

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    Paper Information

    Category: Components and Devices Failure Physics

    Received: May. 31, 2025

    Accepted: --

    Published Online: Sep. 29, 2025

    The Author Email:

    DOI:10.19328/j.cnki.2096-8655.2025.04.012

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