AEROSPACE SHANGHAI, Volume. 42, Issue 4, 103(2025)

Electromagnetic Unlocking Reliability Analysis of Separation Electrical Connectors Based on Digital Models

Xuerong YE, Shanxue ZHAO, and Hao CHEN
Author Affiliations
  • School of Electrical Engineering and Automation,Harbin Institute of Technology,Harbin150001,,China
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    Figures & Tables(16)
    General research idea
    3D model of the separation electrical connector
    3D models of the plug and socket
    Sectional view of the separation locking mechanism
    Analytical procedure of the FMEA
    Sectional view of the assembly
    Mesh generation
    Equivalent stress results of the transmission ring
    Design for the experimental verification
    Simulation results and measured results of the rod speed
    Comparison between the simulation results and measured results
    Flow chart of life prediction
    S-N curve of the transmission ring material Cr12Mov
    Prediction results of the transmission ring life
    • Table 1. Failure mode analysis and severity assessment of the separation locking mechanism

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      Table 1. Failure mode analysis and severity assessment of the separation locking mechanism

      失效模式失效原因故障概率严酷度等级
      钢珠卡滞、变形或受损1) 尺寸设计不当;2) 承受载荷较大;3) 零件磨损C
      电磁分离力小1) 线圈阻值过大;2) 电压过小C
      接触对摩擦力过大1) 接触对间润滑剂失效;2) 接触对磨损;3) 细微杂质进入插孔C
      电磁解锁弹簧力过大1) 弹簧刚度过大;2) 弹簧弹力过大D
      动铁芯与支撑套连接部分分离1) 连接部分胶量较少;2) 在多次电磁分离振动、发热条件下连接部分逐渐开裂E
      传力环断裂1) 材料或工艺原因导致应力集中;2) 电磁分离解锁次数过多,传力环受多次冲击B
      电磁分离阻力过大未解锁1) 对顶弹簧阻力过大;2) 钢珠与拉杆的摩擦力过大C
      插头外壳变形解锁弹开时,插头基座受力过大产生变形E
      分离弹簧磨损使用时压缩力超出了设定范围D
    • Table 2. Specific parameters of the springs

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      Table 2. Specific parameters of the springs

      弹簧名称位置纵向刚度/(N·mm-1预载荷/N
      复位弹簧支架-传力套7.80-84.63
      护套弹簧护套-传力套14.48-264.00
      弹簧拉杆-滑套1.49-10.40
      锁紧弹簧小压圈-卡帽7.39-87.38
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    Xuerong YE, Shanxue ZHAO, Hao CHEN. Electromagnetic Unlocking Reliability Analysis of Separation Electrical Connectors Based on Digital Models[J]. AEROSPACE SHANGHAI, 2025, 42(4): 103

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    Paper Information

    Category: Components and Devices Failure Physics

    Received: May. 31, 2025

    Accepted: --

    Published Online: Sep. 29, 2025

    The Author Email:

    DOI:10.19328/j.cnki.2096-8655.2025.04.012

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