Journal of Infrared and Millimeter Waves, Volume. 43, Issue 3, 1(2024)
Metal microstrip line defect detection of chip based on THz-TDR technology
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Zhen XU, De-Gang XU, Long-Hai LIU, Ji-Ning LI, Jia-Xin ZHANG, Tan WANG, Xiang REN, Xiu-Ming QIAO, Chen JIANG. Metal microstrip line defect detection of chip based on THz-TDR technology[J]. Journal of Infrared and Millimeter Waves, 2024, 43(3): 1
Category: Research Articles
Received: Sep. 7, 2023
Accepted: --
Published Online: Apr. 29, 2024
The Author Email: Ji-Ning LI (jiningli@tju.edu.cn)