1. (a-e) Surface SEM images of CBT-xBi ceramics after thermal etching; (f) XRD patterns of CBT-xBi ceramics and corresponding localized enlarged patterns(a) x=0; (b) x=0.02; (c) x=0.04; (d) x=0.06; (e) x=0.08

2. Dielectric properties of CBT-xBi ceramics(a-c) Dielectric constant as a function of temperature at different frequencies after polarization: (a) x=0, (b) x=0.04 and (c) x=0.06; (d-f) Dielectric constant as a function of temperature at 100 Hz before and after polarization: (d) x=0, (e) x=0.04 and (f) x=0.06

3. XPS core-level spectra of CBT-xBi ceramics(a) O1s; (b) Bi4f; (c) Bi4d_3/2 and Ti2p

4. Characterization of CBT-0.06Bi ceramic sintered in a flowing oxygen atmosphere(a) XRD patterns; (b) SEM image of the thermal etching surface; (c) O1s XPS spectrum; (d) Dielectric temperature spectra at 100 Hz before and after polarization

5. (a) Dielectric temperature spectra of CBT-xBi ceramics; (b) Temperature dependence of DC resistivity of CBT-xBi ceramics; (c) Effect of heat treatment on the piezoelectric constants of CBT-xBi ceramics (set temperature annealing 2 h); (d) In-situ XRD patterns of CBT-0.06Bi ceramic; (e) Relationship between lattice constants and unit cell volume with temperature; (f) (119) peak position and I₍₂₀₀₎/I₍₀₂₀₎ changed with temperature

6. (a) XRD refinement results of CBT-xBi ceramics; (b) Visual crystal structures of CBT-xBi ceramics; (c) Raman scattering spectra in the range of 80-900 cm^-1; (d) Wavenumber displacements of B_2g, B_3g, A_1g, and B_1g modes

7. PFM characterization of CBT-xBi ceramics(a-c) PFM phase images for (a) x=0, (b) x=0.04, and (c) x=0.06; (d-f) PFM amplitude distribution histograms for (d) x=0, (e) x=0.04, and (f) x=0.06; (g) TEM image of CBT-0.06Bi; (h) 5 μm×5 μm PFM phase image of CBT-0.06Bi; (i) Hysteresis loops of CBT-xBi ceramics after polarizing at 180 ℃ and 1 Hz. Colorful figures are available on website