Journal of Semiconductors
Co-Editors-in-Chief
Shushen Li
CN
11-5781/TN
ISSN
1674-4926
Impact Factor
Google Scholar h5-index
Frequency
Monthly issues
Tian Lixin, Du Zechen, Liu Rui, Niu Xiping, Zhang Wenting, An Yunlai, Shen Zhanwei, Yang Fei, and Wei Xiaoguang
Aug. 23, 2022Journal of Semiconductors
DOI:10.1088/1674-4926/43/8/082802
Influence of epitaxial layer structure and cell structure on electrical performance of 6.5 kV SiC MOSFET
Yang Tongtong, Wang Yan, and Yue Ruifeng
Aug. 23, 2022Journal of Semiconductors
DOI:10.1088/1674-4926/43/8/082801
Demonstration of 4H-SiC CMOS digital IC gates based on the mainstream 6-inch wafer processing technique
Zhao Shufang, Ran Wenhao, Wang Lili, and Shen Guozhen
Aug. 23, 2022Journal of Semiconductors
DOI:10.1088/1674-4926/43/8/082601
Interlocked MXene/rGO aerogel with excellent mechanical stability for a health-monitoring device
Xu Wenjing, Chen Jie, Kuang Zhangqu, Zhou Li, Chen Ming, and Zhang Chengbin
Aug. 23, 2022Journal of Semiconductors
DOI:10.1088/1674-4926/43/8/082401
A low-power high-quality CMOS image sensor using 1.5 V 4T pinned photodiode and dual-CDS column-parallel single-slope ADC
He Tianjiang, Liu Suping, Li Wei, Xiong Cong, Lin Nan, Zhong Li, and Ma Xiaoyu
Aug. 23, 2022Journal of Semiconductors
DOI:10.1088/1674-4926/43/8/082301
Research on quantum well intermixing of 680 nm AlGaInP/GaInP semiconductor lasers induced by composited Si–Si3N4 dielectric layer