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Acta Optica Sinica
Editor-in-Chief
Qihuang Gong
CN
31-1252/O4
ISSN
0253-2239
Impact Factor
2.119
Frequency
Semimonthly issues
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Method for Measuring Visibility on Foggy Highways Based on Depth Estimation of Encoder and Decoder
Image Processing
Peng Peng
...
Yucheng Dong, Jiachun Li
and Yitao Yao
|
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Apr. 27, 2025
Acta Optica Sinica
DOI:10.3788/AOS250467
Fixed Linear Superposition Crosstalk Model of Division of Focal Plane Polarization Camera
Imaging Systems
Jiaan Xue
...
Su Qiu, Weiqi Jin, Xia Wang, Lin Luo
and Qiwei Liu
|
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Apr. 27, 2025
Acta Optica Sinica
DOI:10.3788/AOS241779
AlGaInP‑Based Yellow Light Monolithic Integrated Pulse Monitoring Photoelectric Sensor
Remote Sensing and Sensors
Dongmei Wu
...
Hangqi Ge, Ziqi Ye, Yongjin Wang, Zheng Shi
and Xumin Gao
|
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Apr. 27, 2025
Acta Optica Sinica
DOI:10.3788/AOS250457
Dual‑Branch Multimodal Medical Image Fusion Based on Local and Global Information Collaboration
Image Processing
Yu Shen
...
Jiaying Liu, Jiarong Yan, Ruoxuan Wang, Yukun Ma, Jiangcheng Li, Shan Bai, Ziyi Wei, Yangyang Li
and Zhenkai Qiang
|
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Apr. 27, 2025
Acta Optica Sinica
DOI:10.3788/AOS250443
Design and Analysis of Optically Loaded Terahertz Communication and Sensing System Based on OFDM-MSK-LFM
Fiber Optics and Optical Communications
Qi Feng, and Feng Zhao
Apr. 27, 2025
Acta Optica Sinica
DOI:10.3788/AOS241959
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Design of High-Performance Chiral Metasurface Sensors Based on Bound States in Continuum
Acta Optica Sinica
Vol. 45, Issue 2, 0224001 (2025)
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Inverse Design Method for Metasurfaces Based on Residual Architecture
Acta Optica Sinica
Vol. 45, Issue 3, 0324001 (2025)
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Instantaneous Frequency Measurement Based on DP-MZM Modulated AC/DC Power Detection
Acta Optica Sinica
Vol. 44, Issue 21, 2107001 (2024)
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Advanced Metasurface Imaging and Display Based on Multidimensional Light Field Manipulation (Invited)
Acta Optica Sinica
Vol. 44, Issue 14, 1400001 (2024)
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Thermal Emission Manipulation and Its Infrared Applications Based on Metasurfaces (Invited)
Acta Optica Sinica
Vol. 44, Issue 19, 1925001 (2024)
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On-Wafer and In-Line Measurement of Optoelectronic Integrated Chips Based on Photonic Sampling (Invited)
Acta Optica Sinica
Vol. 44, Issue 15, 1513032 (2024)
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