Fig. 1. (a) Schematic for trapping molecules using three charged spherical electrodes; (b) schematic of the image method

Fig. 2. Analytical solutions and numerical solutions of contour distributions of trapping field at YOZ, XOZ and XOY planes. (a)(d) YOZ plane; (b)(e) XOZ plane; (c)(f) XOY plane

Fig. 3. Relationship between position of trap center and voltage U2

Fig. 4. Electric field distributions in Z direction and Stark potential for ND3 molecules in state (|J,K,M>=|1,1,-1>). (a) Loading; (b) trapping

Fig. 5. Relationship between loading efficiency and loading time under different velocities of incident molecular beam

Fig. 6. Relationship between loading efficiency and center velocity of incident molecular beam

Fig. 7. Velocity distributions of incident molecular beam before loading process and the trapped cold molecules. (a) VX; (b) VY; (c) VZ

Fig. 8. Schematic for trapping molecules on a chip with three charged spherical electrodes

Fig. 9. Contour distributions of trapping field. (a) YOZ plane; (b) XOZ plane; (c) XOY plane

Fig. 10. Schematic for trapping molecules on a chip with a series of three charged spherical electrodes (one-dimensional electrostatic lattice)

Fig. 11. Contour distributions of trapping field at two different locations [marked with dashed box in Fig. 9(a)]. (a)(d) XOZ plane; (b)(e) XOY plane; (c)(f) YOZ plane

Fig. 12. Schematic for electrostatic trapping of cold molecules on a chip with a series of three charged spherical electrodes (two-dimensional electrostatic lattice)

Fig. 13. Top view of two-dimensional electrostatic lattice

Fig. 14. Contour distributions of electric field in three different locations (marked with dashed box in Fig. 13) . (a) XOZ plane; (b) XOY plane; (c) YOZ plane