Chinese Journal of Lasers, Volume. 19, Issue 6, 426(1992)

Measurement of refractive index of substrate materials of optical waveguides with a prism coupler

[in Chinese]1 and [in Chinese]2
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  • 1[in Chinese]
  • 2[in Chinese]
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    CLP Journals

    [1] Zhou Jinzhao, Yu Wenfang, Huang Zuohua. Polarized Light Reflection Method for Measuring Thin Film Parameters[J]. Laser & Optoelectronics Progress, 2012, 49(12): 121201

    [2] Zhou Jinzhao, Huang Zuohua, Zeng Xianyou, Zhang Yong. Simultaneous Measurement of Prism and Waveguide Film Parameters by Waveguide Technology[J]. Acta Optica Sinica, 2012, 32(12): 1212001

    [3] Zhou Jinzhao, Song Yajie, Zeng Xianyou, Wang Zebin, Huang Zuohua. Thin Film Parameters Based on Polarized Light Reflected from the Multi-Point Measurement[J]. Chinese Journal of Lasers, 2012, 39(12): 1207002

    [4] Wang Zebin, Zhou Jinzhao, Huang Zuohua. Measuring Refractive Index of Medium Based on Reflectance Curve of Linearly Polarized Light[J]. Laser & Optoelectronics Progress, 2012, 49(12): 121204

    [5] Zhou Jinzhao, Cheng Zhiqing, Huang Zuohua. Accurate Measurement of the Prism Refractive Index by Use of Total Reflection Principle[J]. Laser & Optoelectronics Progress, 2013, 50(1): 11201

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    [in Chinese], [in Chinese]. Measurement of refractive index of substrate materials of optical waveguides with a prism coupler[J]. Chinese Journal of Lasers, 1992, 19(6): 426

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    Paper Information

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    Received: May. 18, 1990

    Accepted: --

    Published Online: Sep. 11, 2007

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