[1] [1] M. Pesch, E. G. Westhoff, T. Ackemann et al.. Observation of a discrete family of dissipative solitons in a nonlinear optical system［J］. Phys. Rev. Lett., 2005, 95(14): 143906

[2] [2] V. J. Fowler, S. H. Maybar. Optical time multiplexing system［P］. US Patent, 3363103, 1968

[3] [3] Yoshiaki Ida. Optical sensing equipment［P］. US Patent, 4644153, 1987

[4] [4] Michael John Downs. Michelson interferometer using matched wedge-shaped beam splitter and compensator［P］. US Patent, 5847828, 1998

[5] [5] James C. Wyant. Advances in interferometric metrology［C］. SPIE, 2002, 4927: 154～162

[6] [6] Zuo Fen, Chen Lei. Development of anti-vibration technology in simultaneous phase-shifting interferometry［J］. Laser & Optoelectronics Progress, 2006, 43(11): 43～48

[7] [7] Song Zhitang, Li Guohua, Peng Handong et al.. Temperature effect of composite compensator［J］. Acta Optica Sinica, 2009, 29(6): 1626～1230

[8] [8] P. A. Williams, A. H. Rose, C. M. Wang. Rotating-polarizer polarimeter for accurate retardance measurement［J］. Appl. Opt., 1997, 36(25): 6466～6472

[9] [9] Wang Wei, Li Guohua, Wu Fuquan et al.. New method for measuring retardation and fast axis of wave plate［J］. Chinese J. Lasers, 2003, 30(12): 1121～1123

[10] [10] Wang Zhengping, Li Qingbo, Tan Qiao et al.. Method of measuring practical retardance value and judging the fast or slow axis of quarter-wave plate［J］. Chinese J. Lasers, 2005, 32(4): 523～528

[11] [11] Ming-Horong Chiu, Cheng-Der Chen, Der-Chin Su. Method for determining the fast axis and phase retardance of a wave plate［J］. J. Opt. Soc. Am. A, 1996, 13(9): 1924～1929

[12] [12] Ren Hongliang, Wang Jiuyang, Lou Liren et al.. Measuring phase retardation and fast axis azimuth of a wave plate using Michelson interferometer［J］. Chinese J. Lasers, 2008, 35(2): 249～253

[13] [13] Baoliang Wang, Theodore C. Oakerg. A new instrument for measuring both the magnitude and angle of low level linear birefringence [J]. Rev. Sci. Instr., 1999, 70(10): 3847～3854

[14] [14] Hu Jianming, Zeng Aijun, Wang Xiangzhao. New method for measuring retardation of quarter-wave plate [J]. Chinese J. Lasers, 2006, 33(5): 659～662

[15] [15] Li Fanyue, Han Jie, Zeng Aijun et al.. Method for measuring retardation by swinging quarter-wave plate with phase modulator［J］. Chinese J. Lasers, 2011, 38(2): 0208003

[16] [16] Yu Daoyin, Tan Hengying. Engineering Optics［M］. Beijing: China Machine Press, 2000. 442～443