Fig. 1. Cherenkov radiation from a single electron

Fig. 2. Layout of the simulation work basing on measurement system principle

Fig. 3. Divergence images for ideal electron beam after passing through SiO₂ slice with different thickness

Fig. 4. Impulsion response function of SiO₂ slice and Mylar film with different thickness

Fig. 5. Influence of index of SiO₂ detector on beam divergence

Fig. 6. Measurement precision simulation for different beam divergence

Fig. 7. Comparison of electron beam divergence with different simulation methods