Experimental Study on Birefringence Dispersion for Liquid Crystal Mixture by Sellmeier Model

Liu Tiecheng; Hu Jingpei; Zhu Linglin; Zhou Ruyi; Zhang Chong; Zeng Aijun; Huang Huijie

doi:10.3788/CJL202047.0804002

Chinese Journal of Lasers, Volume. 47, Issue 8, 804002(2020)

Experimental Study on Birefringence Dispersion for Liquid Crystal Mixture by Sellmeier Model

Liu Tiecheng^1,2, Hu Jingpei¹, Zhu Linglin¹, Zhou Ruyi^1,2, Zhang Chong^1,2, Zeng Aijun^1,2, and Huang Huijie^1,2

¹Laboratory of Information Optics and Optoelectronic Technology, Shanghai Institute of Optics and Fine Mechanics,Chinese Academy of Sciences, Shanghai, 201800, China

²Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences,Beijing 100049, China

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Figures & Tables(6)

Fig. 1. Polarized absorption spectrum and difference of polarization absorbance of liquid crystals mixture with the wavelength change. (a) Polarized absorption spectrum. (b) difference of polarization absorbance with the wavelength change

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Fig. 2. Fitting values, measured values, and difference of birefringence dispersion of liquid crystals mixture at 20 ℃. (a) Fitting values (black solid line) and measured values (red circles) using extended Cauchy model; (b) difference between fitting and measured values using extended Cauchy model. (c) fitting values (black solid line) and measured values (red circles) using Sellmeier model; (d) difference between fitting and measured values using Sellmeier model

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Table 1. Measurement accuracy of spectroscopic ellipsometer
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Table 1. Measurement accuracy of spectroscopic ellipsometer
Wave plate Theoreticalvalue /nm Measuredvalue /nm Deviation /nm
One eighthwave plate 79.125 79.956 0.001λ
Quarterwave plate 158.250 158.958 0.001λ

Table 2. Fitting coefficients and χ² for extended-Cauchy model and Sellmeier model of liquid crystals mixture at 20 ℃
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Table 2. Fitting coefficients and χ² for extended-Cauchy model and Sellmeier model of liquid crystals mixture at 20 ℃
Model Δn
Extended Cauchy A' B' C' χ²
0.0959 0.0309 0.0058 0.0349
Sellmeier B'₁ B'₂ B'₃ C'₁ C'₂ C'₃ χ²
-0.2876+0.0001i 0.1562+0.2139i -0.8175+0.2137i 0.0667+0.0402i 0.0923-0.0124i -0.0173+0.0120i 0.0019

Table 3. Measured values, fitting values, and deviation for extended Cauchy model and Sellmeier model of liquid crystals mixture at 589 nm, 20 ℃
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Table 3. Measured values, fitting values, and deviation for extended Cauchy model and Sellmeier model of liquid crystals mixture at 589 nm, 20 ℃
Model Fitting value /nm Deviation /%
Extended Cauchy 0.2335 0.35
Sellmeier 0.2372 0.02
Measured value,Δn 0.237

Table 4. Measured values, fitting values, and deviation for extended Cauchy model and Sellmeier model of liquid crystals mixture at 378 nm, 20 ℃
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Table 4. Measured values, fitting values, and deviation for extended Cauchy model and Sellmeier model of liquid crystals mixture at 378 nm, 20 ℃
Model Fitting value /nm Deviation /%
Extended Cauchy 0.5983 2.42
Sellmeier 0.6133 0.92
Measured value,Δn 0.6225

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Liu Tiecheng, Hu Jingpei, Zhu Linglin, Zhou Ruyi, Zhang Chong, Zeng Aijun, Huang Huijie. Experimental Study on Birefringence Dispersion for Liquid Crystal Mixture by Sellmeier Model[J]. Chinese Journal of Lasers, 2020, 47(8): 804002

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Paper Information

Category: Measurement and metrology

Received: Dec. 18, 2019

Accepted: --

Published Online: Aug. 17, 2020

The Author Email:

DOI:10.3788/CJL202047.0804002

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology

Table 1. Measurement accuracy of spectroscopic ellipsometer

Table 1. Measurement accuracy of spectroscopic ellipsometer

Table 2. Fitting coefficients and χ2 for extended-Cauchy model and Sellmeier model of liquid crystals mixture at 20 ℃

Table 2. Fitting coefficients and χ2 for extended-Cauchy model and Sellmeier model of liquid crystals mixture at 20 ℃

Table 3. Measured values, fitting values, and deviation for extended Cauchy model and Sellmeier model of liquid crystals mixture at 589 nm, 20 ℃

Table 3. Measured values, fitting values, and deviation for extended Cauchy model and Sellmeier model of liquid crystals mixture at 589 nm, 20 ℃

Table 4. Measured values, fitting values, and deviation for extended Cauchy model and Sellmeier model of liquid crystals mixture at 378 nm, 20 ℃

Table 4. Measured values, fitting values, and deviation for extended Cauchy model and Sellmeier model of liquid crystals mixture at 378 nm, 20 ℃

Table 2. Fitting coefficients and χ² for extended-Cauchy model and Sellmeier model of liquid crystals mixture at 20 ℃

Table 2. Fitting coefficients and χ² for extended-Cauchy model and Sellmeier model of liquid crystals mixture at 20 ℃