Chinese Optics Letters, Volume. 15, Issue 11, 111602(2017)

Investigation on optical and photoluminescence properties of organic semiconductor Al-Alq3 thin films for organic light-emitting diodes application

Fan Zhang, Cong Wang, Kai Yin, Xinran Dong, Yuxin Song, Yaxiang Tian, and Ji’an Duan*
Author Affiliations
  • State Key Laboratory of High Performance and Complex Manufacturing, College of Mechanical and Electrical Engineering, Central South University, Changsha 410083, China
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    Figures & Tables(4)
    (a) AFM image of the Al-Alq3 sample; (b) schematic diagram of the four-layer structure model applied in the SE data fitting.
    (Color online) Experimental (dotted lines) and calculated (solid lines) SE data for 40% Al fraction Al-Alq3 thin film at incidence angles 65°, 70°, and 75°.
    (Color online) (a) Refractive index n and (b) extinction coefficient k of Al-Alq3 thin films with various Al fractions.
    (Color online) (a) PL spectra of Al-Alq3 thin films with different Al fractions. (b) The resistivity as a function of the Al volume fraction in Al-Alq3 thin films.
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    Fan Zhang, Cong Wang, Kai Yin, Xinran Dong, Yuxin Song, Yaxiang Tian, Ji’an Duan, "Investigation on optical and photoluminescence properties of organic semiconductor Al-Alq3 thin films for organic light-emitting diodes application," Chin. Opt. Lett. 15, 111602 (2017)

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    Paper Information

    Category: Materials

    Received: Jun. 18, 2017

    Accepted: Sep. 22, 2017

    Published Online: Jul. 19, 2018

    The Author Email: Ji’an Duan (duanjian@csu.edu.cn)

    DOI:10.3788/COL201715.111602

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