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Acta Optica Sinica, Volume. 32, Issue 8, 831001(2012)

Determination of Thickness and Optical Constants of Sol-Gel Derived TiO2 Films by Combined Analysis of Transmittance and X-Ray Reflectivity Spectra

Jia Hongbao1,2、*, Sun Jinghua1,2,3, Xu Yao1, Wu Dong1, Lü Haibing3, Yan Lianghong3, and Yuan Xiaodong3
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    Article index updated: Sep. 6, 2025

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    Jia Hongbao, Sun Jinghua, Xu Yao, Wu Dong, Lü Haibing, Yan Lianghong, Yuan Xiaodong. Determination of Thickness and Optical Constants of Sol-Gel Derived TiO2 Films by Combined Analysis of Transmittance and X-Ray Reflectivity Spectra[J]. Acta Optica Sinica, 2012, 32(8): 831001

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    Paper Information

    Category: Thin Films

    Received: Feb. 10, 2012

    Accepted: --

    Published Online: Jun. 25, 2012

    The Author Email: Jia Hongbao (hbjia@yahoo.cn)

    DOI:10.3788/aos201232.0831001

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology