Spectroscopy and Spectral Analysis, Volume. 36, Issue 5, 1296(2016)

A New Method for Measurement of Laser-Induced Damage Threshold

GE Jin-man1,2、*, SU Jun-hong1,2, CHEN Lei1, and L Ning2
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  • 1[in Chinese]
  • 2[in Chinese]
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    References(6)

    [1] [1] Chen S, Zhao Y, He H, et al. Chin. Opt. Let., 2011, 9(8): 083101.

    [2] [2] Papandrew A B, Stolz C J, Wu Z L. et al. SPIE, 2001, 4347: 53.

    [4] [4] Woods B, Runkel M, Yan M, et al. SPIE, 1998, 3578: 302.

    [8] [8] Tran X, Huoc P. Optics and Laser in Engineering, 2006, 44: 520.

    [11] [11] Wang Bin, Qin Yuan, Ni Xiaowu, et al. Applied Optics, 2010, 49(29): 5537.

    [12] [12] Marco Jupé, Lars Jensen, Andrius Melninkaitis, et al. Optics Express, 2009, 17(15): 12269.

    CLP Journals

    [1] SU Jun-hong, XU Jun-qi, WANG Gui-xia, LI Jian-chao. Survey of Damage Identification Methods for Optical Film Elements Induced by Pulsed Lasers[J]. OPTICS & OPTOELECTRONIC TECHNOLOGY, 2023, 21(1): 1

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    GE Jin-man, SU Jun-hong, CHEN Lei, L Ning. A New Method for Measurement of Laser-Induced Damage Threshold[J]. Spectroscopy and Spectral Analysis, 2016, 36(5): 1296

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    Paper Information

    Received: Aug. 30, 2015

    Accepted: --

    Published Online: Dec. 20, 2016

    The Author Email: GE Jin-man (gjm129@163.com)

    DOI:10.3964/j.issn.1000-0593(2016)05-1296-04

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