Researching | Visual Detection of Stockbridge Damper Slip on Power Transmission Lines Based on Key Points

Laser & Optoelectronics Progress, Volume. 57, Issue 20, 201502(2020)

Visual Detection of Stockbridge Damper Slip on Power Transmission Lines Based on Key Points

Youwei Liu^1、*, Shaosheng Fan¹, Lijun Tang², Yong Feng², and Haotao Li²

Author Affiliations

¹School of Electrical & Information Engineering, Changsha University of Science & Technology, Changsha, Hunan 410114, China;

²Electric Power Research Institute, Yunnan Power Grid Co., Ltd., Kunming, Yunnan 650217, China

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Figures & Tables(9)

Fig. 1. Relationship schematic of coordinate system in imaging process

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Fig. 2. Schematic of key points of stockbridge damper

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Fig. 3. Schematic of stockbridge damper slip

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Fig. 4. Diagram of stockbridge damper size

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Fig. 5. Schematic of calculating clamp key point P

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Fig. 6. Detection results of cascade network. (a) Multiple stockbridge dampers; (b) single stockbridge damper

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Fig. 8. Curve of distance deviation

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Table 1. Main sizes of FR-2 stockbridge damperunit: mm
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Table 1. Main sizes of FR-2 stockbridge damperunit: mm
Parameter A L L₁ L₂ H₁ H₂
Value 50 429 190 239 105 12

Table 2. Statistics of recognition results of stockbridge damper
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Table 2. Statistics of recognition results of stockbridge damper
Network New default box P_accuracy /% R_recall /% Running time /ms
Original SSD (1) × 88.90 85.70 98
Original SSD (2) √ 89.01 86.23 98
SSD-InceptionV2 √ 89.36 89.06 54
SSD-MobileNetV3 √ 91.86 88.86 37

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Youwei Liu, Shaosheng Fan, Lijun Tang, Yong Feng, Haotao Li. Visual Detection of Stockbridge Damper Slip on Power Transmission Lines Based on Key Points[J]. Laser & Optoelectronics Progress, 2020, 57(20): 201502

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Paper Information

Category: Machine Vision

Received: Jan. 19, 2020

Accepted: Feb. 24, 2020

Published Online: Oct. 14, 2020

The Author Email: Youwei Liu (erwill@qq.com)

DOI:10.3788/LOP57.201502

Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology