Chinese Journal of Lasers, Volume. 13, Issue 2, 86(1986)

Diffraction of layered phase grating and its application in measurement and test

Wang Baocheng
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  • [in Chinese]
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    References(2)

    [1] [1] F. Hock; “Photoebktrische Messnng der Anda-rvmg von Langen oder Winkslpositionea mit Hilfe von Beug ungsgittern”, Disser tation, Stuttgart, 1976.

    [4] [4] “Die im 3. Forsch ungsjahr geplantsn Anwendun-gen und Yergleiohe mit anderen Messmethoden”, Abscblussbericht, IFMM TU Hannover, 1980.

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    Wang Baocheng. Diffraction of layered phase grating and its application in measurement and test[J]. Chinese Journal of Lasers, 1986, 13(2): 86

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    Paper Information

    Category: laser devices and laser physics

    Received: Oct. 30, 1984

    Accepted: --

    Published Online: Aug. 2, 2012

    The Author Email:

    DOI:

    CSTR:32186.14.

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