Influence of Light Sources of Different Wavelengths on Scattering Rate of Defects

Table 1. Partial characteristic parameter table of photomultiplier tube
View table
Table 1. Partial characteristic parameter table of photomultiplier tube
Parameter type Value
Anode sensitivity /（V·nW^-1） 15
Cathode sensitivity /（mA·W^-1） 78
Current gain M 10⁵

Table 2. Reference voltage values corresponding to light sources of different wavelengths (80 mW)
View table
Table 2. Reference voltage values corresponding to light sources of different wavelengths (80 mW)
λ /nm Reference voltage value /V Average voltage value /V
635 3.7600 3.7620 3.7590 3.7603
525 2.9210 2.9200 2.9180 2.9197
405 0.3715 0.3720 0.3718 0.3718

Table 3. Reference voltage values corresponding to light sources of different wavelengths (50 mW)
View table
Table 3. Reference voltage values corresponding to light sources of different wavelengths (50 mW)
λ /nm Reference voltage value /V Average voltage value /V
635 2.5700 2.5690 2.5710 2.5700
525 1.9780 1.9770 1.9790 1.9780
405 0.2559 0.2560 0.2561 0.2560

Table 4. Voltage values of sample to be tested corresponding to light sources of different wavelengths (80 mW)
View table
Table 4. Voltage values of sample to be tested corresponding to light sources of different wavelengths (80 mW)
λ /nm Sample voltage value /V Average voltage value /V
635 3.7555 3.7560 3.7558 3.7558
525 3.0350 3.0360 3.0340 3.0350
405 0.4510 0.4513 0.4508 0.4510

Table 5. Voltage values of sample to be tested corresponding to light sources of different wavelengths (50 mW)
View table
Table 5. Voltage values of sample to be tested corresponding to light sources of different wavelengths (50 mW)
λ /nm Sample voltage value /V Average voltage value /V
635 2.5600 2.5590 2.5610 2.5600
525 2.0210 2.0220 2.0200 2.0210
405 0.3060 0.3061 0.3059 0.3060

Table 6. Scattering rate data of sample to be tested corresponding to light sources of different wavelengths (80 mW)
View table
Table 6. Scattering rate data of sample to be tested corresponding to light sources of different wavelengths (80 mW)
λ /nm Scattering rate
635 0.009988
525 0.010395
405 0.012130

Table 7. Scattering rate data of the sample to be tested corresponding to light sources of different wavelengths (50 mW)
View table
Table 7. Scattering rate data of the sample to be tested corresponding to light sources of different wavelengths (50 mW)
λ /nm Scattering rate
635 0.009961
525 0.010217
405 0.011953

Table 8. Voltage value of sample to be tested corresponding to light sources of different wavelengths (80 mW)
View table
Table 8. Voltage value of sample to be tested corresponding to light sources of different wavelengths (80 mW)
λ /nm Sample voltage value /V Average voltage value /V
635 4.4300 4.4295 4.4297 4.4297
525 3.6920 3.6917 3.6922 3.6920
405 0.5780 0.5778 0.5782 0.5780

Table 9. Scattering rate data of sample to be tested corresponding to light sources of different wavelengths (80 mW)
View table
Table 9. Scattering rate data of sample to be tested corresponding to light sources of different wavelengths (80 mW)
λ /nm Scattering rate
635 0.011780
525 0.012645
405 0.015546

Table 10. Voltage value of sample to be tested corresponding to light sources of different wavelengths (50 mW)
View table
Table 10. Voltage value of sample to be tested corresponding to light sources of different wavelengths (50 mW)
λ /nm Sample voltage value /V Average voltage value /V
635 2.9870 2.9868 2.9871 2.9870
525 2.4340 2.4339 2.4338 2.4339
405 0.3680 0.3677 0.3681 0.3679

Table 11. Scattering rate data of sample to be tested corresponding to light sources of different wavelengths (50 mW)
View table
Table 11. Scattering rate data of sample to be tested corresponding to light sources of different wavelengths (50 mW)
λ /nm Scattering rate
635 0.011623
525 0.012305
405 0.014371

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Xudong Wang, Aihua Gao, Lirong Yan, Wengang Qin, Wenjin Li. Influence of Light Sources of Different Wavelengths on Scattering Rate of Defects[J]. Laser & Optoelectronics Progress, 2022, 59(11): 1112002

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Paper Information

Category: Instrumentation, Measurement and Metrology

Received: Jun. 28, 2021

Accepted: Jul. 20, 2021

Published Online: Jun. 9, 2022

The Author Email: Aihua Gao (freegah@126.com)

DOI:10.3788/LOP202259.1112002

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology

Table 1. Partial characteristic parameter table of photomultiplier tube

Table 1. Partial characteristic parameter table of photomultiplier tube

Table 2. Reference voltage values corresponding to light sources of different wavelengths (80 mW)

Table 2. Reference voltage values corresponding to light sources of different wavelengths (80 mW)

Table 3. Reference voltage values corresponding to light sources of different wavelengths (50 mW)

Table 3. Reference voltage values corresponding to light sources of different wavelengths (50 mW)

Table 4. Voltage values of sample to be tested corresponding to light sources of different wavelengths (80 mW)

Table 4. Voltage values of sample to be tested corresponding to light sources of different wavelengths (80 mW)

Table 5. Voltage values of sample to be tested corresponding to light sources of different wavelengths (50 mW)

Table 5. Voltage values of sample to be tested corresponding to light sources of different wavelengths (50 mW)

Table 6. Scattering rate data of sample to be tested corresponding to light sources of different wavelengths (80 mW)

Table 6. Scattering rate data of sample to be tested corresponding to light sources of different wavelengths (80 mW)

Table 7. Scattering rate data of the sample to be tested corresponding to light sources of different wavelengths (50 mW)

Table 7. Scattering rate data of the sample to be tested corresponding to light sources of different wavelengths (50 mW)

Table 8. Voltage value of sample to be tested corresponding to light sources of different wavelengths (80 mW)

Table 8. Voltage value of sample to be tested corresponding to light sources of different wavelengths (80 mW)

Table 9. Scattering rate data of sample to be tested corresponding to light sources of different wavelengths (80 mW)

Table 9. Scattering rate data of sample to be tested corresponding to light sources of different wavelengths (80 mW)

Table 10. Voltage value of sample to be tested corresponding to light sources of different wavelengths (50 mW)

Table 10. Voltage value of sample to be tested corresponding to light sources of different wavelengths (50 mW)

Table 11. Scattering rate data of sample to be tested corresponding to light sources of different wavelengths (50 mW)

Table 11. Scattering rate data of sample to be tested corresponding to light sources of different wavelengths (50 mW)