Acta Optica Sinica, Volume. 28, Issue s2, 143(2008)
Crushing Cells under Low-Voltage and Its Optical Testing Method
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Chen Jianjun, Liao Honghua, Wang Jun, Han Heyou, Yu Jun. Crushing Cells under Low-Voltage and Its Optical Testing Method[J]. Acta Optica Sinica, 2008, 28(s2): 143
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