[1] [1] Grischkowsky D, Keiding S, Exter M V, et al.. Far- infrared time- domain spectroscopy with terahertz beams of dielectrics and semiconductors[J]. J Opt Soc Amer B, 1990, 7(10): 2006-2015.

[2] [2] Exter M V, Grischkowsky D. Optical and electronic properties of doped silicon from 0.1 to 2 THz[J]. Appl Phys Lett, 1990, 56(17): 1694-1696.

[3] [3] Pedersen J E, Keiding S R. THz time-domain spectroscopy of nonpolar liquids[J]. IEEE J Quantum Electron, 1992, 28(10): 2518-2522.

[4] [4] Whitaker J F, Gao F, Liu Y. Terahertz-bandwidth pulses for coherent time-domain spectroscopy[C]. SPIE, 1994, 2145: 168-177.

[5] [5] Duvillaret L, Garet F, Coutaz J L. A reliable method for extraction of material parameters in THz time-domain spectroscopy[J]. IEEE J Select Topics Quantum Electron, 1996, 2(3): 739-746.

[6] [6] Duvillaret L, Garet F, Coutaz J. Highly precise determination of optical constants and sample thickness in terahertz time-domain spectroscopy[J]. Appl Opt, 1999, 38(2): 409-415.

[7] [7] Dorney T, Baraniuk R, Mittleman D. Material parameter estimation with terahertz time-domain spectroscopy[J]. J Opt Soc Am A, 2001, 18(7): 1562-1571.

[8] [8] Pupeza I, Wilk R, Koch M. Highly accurate optical material parameter determination with THz time-domain spectroscopy[J]. Opt Express, 2007, 15(7): 4335-4350.

[9] [9] Withayachumnankul W, Fischer B M, Abbott D. Material thickness optimization for transmission- mode terahertz time- domain spectroscopy[J]. Opt Express, 2008, 16(10): 7382-7396.

[10] [10] Scheller M, Koch M. Fast and accurate thickness determination of unknown materials using terahertz time domain spectroscopy[J]. J of Infrared Millimeter & terahertz Waves, 2009, 30(7): 762-769.