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Acta Optica Sinica, Volume. 41, Issue 4, 0411001(2021)

Fourier Ptychographic Microscopy Based on a Weighted Apodized Transfer Function Constraint

Fen Zhang, Yeqian Zhou*, Xichong You, and Hong Cheng
Author Affiliations
  • National Engineering Research Center for Agro-Ecological Big Data Analysis & Application, Anhui University, Hefei, Anhui 230601, China
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    Figures&Tables (15)
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    References (21)
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    Figures & Tables(15)
    Schematic diagram of FPM imaging system

    Fig. 1. Schematic diagram of FPM imaging system

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    Reconstruction process of FPM

    Fig. 2. Reconstruction process of FPM

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    Acquired low-resolution image

    Fig. 3. Acquired low-resolution image

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    Three constraints and acquired low-resolution images. (a1) Three-dimensional image of CTF; (b1) three-dimensional image of AC; (c1) three-dimensional image of B-AC; (a2) low-resolution image under CTF constraint; (b2) low-resolution image under AC constraint; (c2) low-resolution image under B-AC constraint

    Fig. 4. Three constraints and acquired low-resolution images. (a1) Three-dimensional image of CTF; (b1) three-dimensional image of AC; (c1) three-dimensional image of B-AC; (a2) low-resolution image under CTF constraint; (b2) low-resolution image under AC constraint; (c2) low-resolution image under B-AC constraint

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    Attenuation parameters a and MSE and SSIM curves of reconstructed images. (a) MSE; (b) SSIM

    Fig. 5. Attenuation parameters a and MSE and SSIM curves of reconstructed images. (a) MSE; (b) SSIM

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    Reconstructed intensity and phase under three constraints without noise. (a1)(a2) Original intensity and phase; (b1)(b2) reconstructed intensity and phase under CTF constraint; (c1)(c2) reconstructed intensity and phase under AC constraint; (d1)(d2) reconstructed intensity and phase under B-AC constraint

    Fig. 6. Reconstructed intensity and phase under three constraints without noise. (a1)(a2) Original intensity and phase; (b1)(b2) reconstructed intensity and phase under CTF constraint; (c1)(c2) reconstructed intensity and phase under AC constraint; (d1)(d2) reconstructed intensity and phase under B-AC constraint

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    Reconstructed intensity and phase under three constraints with different noises. (a1)(a2) Reconstructed intensity and phase under CTF constraint with Gaussian noise; (b1)(b2) reconstructed intensity and phase under AC constraint with Gaussian noise; (c1)(c2) reconstructed intensity and phase under B-AC constraint with Gaussian noise; (d1)(d2) reconstructed intensity and phase under CTF constraint with Poisson noise; (e1)(e2) intensity phase reconstruction under AC constraint with Poisson noise;

    Fig. 7. Reconstructed intensity and phase under three constraints with different noises. (a1)(a2) Reconstructed intensity and phase under CTF constraint with Gaussian noise; (b1)(b2) reconstructed intensity and phase under AC constraint with Gaussian noise; (c1)(c2) reconstructed intensity and phase under B-AC constraint with Gaussian noise; (d1)(d2) reconstructed intensity and phase under CTF constraint with Poisson noise; (e1)(e2) intensity phase reconstruction under AC constraint with Poisson noise;

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    Curves of noise level and evaluation criterion under three constraints. (a) MSE; (b) SSIM

    Fig. 8. Curves of noise level and evaluation criterion under three constraints. (a) MSE; (b) SSIM

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    Reconstructed intensity and phase under three constraints in EPRY-FPM algorithm. (a1)(a2) Reconstructed intensity and phase under CTF constraint; (b1)(b2) reconstructed intensity and phase under AC constraint; (c1)(c2) reconstructed intensity and phase under B-AC constraint

    Fig. 9. Reconstructed intensity and phase under three constraints in EPRY-FPM algorithm. (a1)(a2) Reconstructed intensity and phase under CTF constraint; (b1)(b2) reconstructed intensity and phase under AC constraint; (c1)(c2) reconstructed intensity and phase under B-AC constraint

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    Low-resolution images acquired by CCD

    Fig. 10. Low-resolution images acquired by CCD

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    FPM imaging system

    Fig. 11. FPM imaging system

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    Reconstructed intensity and phase under three constraints. (a1)(a2) Reconstructed intensity and phase under CTF constraint; (b1)(b2) reconstructed intensity and phase under AC constraint; (c1)(c2) reconstructed intensity and phase under B-AC constraint

    Fig. 12. Reconstructed intensity and phase under three constraints. (a1)(a2) Reconstructed intensity and phase under CTF constraint; (b1)(b2) reconstructed intensity and phase under AC constraint; (c1)(c2) reconstructed intensity and phase under B-AC constraint

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    • Table 1. Reconstruction results of three different constraints

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      Table 1. Reconstruction results of three different constraints

      Evaluation criterionCTF constraintAC constraintB-AC constraint
      MSE0.01850.01480.0118
      SSIM0.71560.76480.8334

    • Table 2. Comparison of reconstruction results of three constraints with different noises

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      Table 2. Comparison of reconstruction results of three constraints with different noises

      NoiseCTF constraintAC constraintB-AC constraint
      MSESSIMMSESSIMMSESSIM
      Gaussian0.01940.70380.01590.76190.01410.8041
      Poisson0.01860.71640.01530.75770.01370.8163

    • Table 3. Comparison of reconstruction results of three constraints in EPRY-FPM algorithm

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      Table 3. Comparison of reconstruction results of three constraints in EPRY-FPM algorithm

      Evaluation criterionCTF constraintAC constraintB-AC constraint
      MSE0.01890.01470.0140
      SSIM0.70800.77060.8098
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    Fen Zhang, Yeqian Zhou, Xichong You, Hong Cheng. Fourier Ptychographic Microscopy Based on a Weighted Apodized Transfer Function Constraint[J]. Acta Optica Sinica, 2021, 41(4): 0411001

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    Paper Information

    Category: Imaging Systems

    Received: Aug. 4, 2020

    Accepted: Sep. 24, 2020

    Published Online: Feb. 26, 2021

    The Author Email: Yeqian Zhou (3151545506@qq.com)

    DOI:10.3788/AOS202141.0411001

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology