An optical phase retardance spectrum measurement method

ZHAO Yali; YANG Jingjie; ZHANG Xusheng

Optical Technique, Volume. 49, Issue 6, 723(2023)

ZHAO Yali^*, YANG Jingjie, and ZHANG Xusheng

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[in Chinese]

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References(2)

[9] [9] Koleják P, Vala D, Postava K, et al. Mueller matrix ellipsometry of waveplates for control of their properties and alignment［J］. Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena,2020,38(1):014006.

[10] [10] Gu H, Chen X, Shi Y, et al. Comprehensive characterization of a general composite waveplate by spectroscopic Mueller matrix polarimetry［J］. Optics Express,2018,26(19):25408-25425.

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ZHAO Yali, YANG Jingjie, ZHANG Xusheng. An optical phase retardance spectrum measurement method[J]. Optical Technique, 2023, 49(6): 723

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