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Laser Technology, Volume. 43, Issue 4, 585(2019)

Ellipsometric characterization of the thickness of gradient dielectric films on PET composite substrates

GUO Chunfu1, ZHANG Chuanwei1,2, LI Weiqi1, LI Xiaoping3、*, and LIU Shiyuan1,2,3
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  • 3[in Chinese]
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    GUO Chunfu, ZHANG Chuanwei, LI Weiqi, LI Xiaoping, LIU Shiyuan. Ellipsometric characterization of the thickness of gradient dielectric films on PET composite substrates[J]. Laser Technology, 2019, 43(4): 585

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    Paper Information

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    Received: Dec. 4, 2018

    Accepted: --

    Published Online: Jul. 10, 2019

    The Author Email: LI Xiaoping (lixp@mail.hust.edu.cn)

    DOI:10.7510/jgjs.issn.1001-3806.2019.04.026

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology