Fig. 1. Schematic diagram of interaction between incident electron and dielectric material and energy loss: (a) Interaction between incident electron and dielectric material; (b) diagram of stopping power and penetration depth.入射电子与介质材料相互作用及能量损失示意图　(a) 入射电子与介质材料相互作用示意图; (b)阻止能量与穿透深度关系图

Fig. 2. The charge deposition rate distributions in typical insulation dielectric.典型绝缘介质内部电荷沉积速率分布

Fig. 3. Schematic diagram of charge transfer model under electron beam radiation: (a) RIC model; (b) GR model.电子束辐射下介质内部电荷迁移模型示意图　(a) RIC模型; (b) GR模型

Fig. 4. Space charge decay curve of polyimide treated by electron radiation treatment: (a) The upper surface of the sample is treated; (b) the bottom surface of the sample is treated.电子辐射处理后PI空间电荷衰减曲线　(a) 电子辐射处理试样上表面; (b) 电子辐射处理试样下表面

Fig. 5. Schematic diagram of space charge in situ measurement setup under electron beam radiation: (a) Short circuit PEA; (b) open circuit PEA.电子束辐射下绝缘介质空间电荷原位测量装置示意图　(a) 短路PEA; (b) 开路PEA

Fig. 6. Surface potential measuring system of insulation under electron radiation.电子辐射下绝缘介质表面电位测量系统

Fig. 7. Trap energy spectrum distribution of PI under electron radiation with different energies^[34]. 不同能量电子辐射下PI陷阱能谱分布图^[34]