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Opto-Electronic Engineering, Volume. 39, Issue 9, 132(2012)

Test of Transient Temperature for Spectrum Distribution of the Speckle Pattern Interferometry

WU Jin-hui1,2、*, YANG Rui-feng1,2, WANG Gao1,2, and ZHAO Mao-tai1,2
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    WU Jin-hui, YANG Rui-feng, WANG Gao, ZHAO Mao-tai. Test of Transient Temperature for Spectrum Distribution of the Speckle Pattern Interferometry[J]. Opto-Electronic Engineering, 2012, 39(9): 132

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    Paper Information

    Received: Feb. 18, 2012

    Accepted: --

    Published Online: Jan. 8, 2013

    The Author Email: Jin-hui WU (wujinhui_1234@163.com)

    DOI:10.3969/j.issn.1003-501x.2012.09.021

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology