Acta Optica Sinica, Volume. 44, Issue 16, 1610001(2024)

Adaptive Wavelet Threshold Denoising Based on Pixel Dark Noise of EBAPS

Xuan Liu1, Bingzhen Li1, Li Li1、*, Weiqi Jin1, and Hongchang Cheng2
Author Affiliations
  • 1Key Laboratory of Photoelectronic Imaging Technology and System, Ministry of Education, Beijing Institute of Technology, Beijing 100081, China
  • 2Science and Technology on Low-Light-Level Night Vision Laboratory, Xi’an 710065, Shaanxi , China
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    Figures & Tables(14)
    Schematic of EBAPS imaging[20]
    Ideal total noise PTC curve for CMOS/CCD
    Schematic of experimental setup
    Schematic of physical object and structural particularity of EBAPS
    Different regions of EBAPS image (solid green line box indicates the dark pixel area, and solid red line box indicates the effective signal area)
    Signal mean versus standard deviation for difference image
    Histogram distribution of image with different mean values. (a) Mean value is 93; (b) mean value is 166; (c) mean value is 466; (d) mean value is 749; (e) mean value is 2223; (f) mean value is 3283
    Difference image of adjacent frames (enhanced image for valid show)
    Flow chart of AWT-PDN algorithm
    Comparison of single frame images and mean values of 50 images under different illuminances. (a) Single frame images; (b) 50 images
    Experiment results of denoising methods for scene 1 under different illuminances. (a) 1×10-1 lx; (b) 5×10-2 lx; (c) 1×10-2 lx; (d) 5×10-3 lx
    Experiment results of denoising methods for scene 2 under different illuminances. (a) 1×10-1 lx; (b) 5×10-2 lx; (c) 1×10-2 lx; (d) 5×10-3 lx
    • Table 1. Sources of noise in EBAPS images

      View table

      Table 1. Sources of noise in EBAPS images

      Type of noiseSourceCharacteristic
      Signal-dependent noise σP2Photon shot noise, dark electron emission noise, and dark current shot noiseRandom distribution in space and time, dependent on signal strength
      Signal-independent noise σN2Transverse electron diffusion and read noiseRandom distribution in space and time, independent on signal strength
      Fixed pattern noise N02Silicon material and processing technologyFixed distribution
    • Table 2. Evaluation indices of image processed by different methods

      View table

      Table 2. Evaluation indices of image processed by different methods

      Illuminance /lxMethodScene 1Scene 2
      PSNRSSIMAFDPSNRSSIMAFD
      1×10-1Oringinal28.67860.69618.290728.70490.69658.4357
      UT31.38070.83795.181430.69570.80456.1660
      Rigrsure29.51550.74337.307329.45230.73687.5533
      Min-max31.63420.84764.931931.76100.84955.0776
      WTDA30.65270.80645.954130.73110.80636.1212
      Improved-WDM31.66810.84864.949431.76460.84925.1215
      AWT-PDN30.82720.84014.190630.93090.83324.5949
      5×10-2Oringinal28.00760.68798.869227.60410.66129.5644
      UT30.39670.81805.773429.45510.77036.9302
      Rigrsure28.77920.73367.843730.51120.70758.4860
      Min-max30.63770.82635.533627.60410.80995.7640
      WTDA29.78310.79336.463129.58950.77616.7664
      Improved-WDM30.73940.82925.496030.64960.81375.6692
      AWT-PDN31.24510.84074.471731.34210.82874.6236
      1×10-2Oringinal32.00670.78765.272331.23810.75905.9366
      UT34.20140.86403.539632.88640.82594.3909
      Rigrsure32.51980.80864.827531.76420.85195.4190
      Min-max34.42750.86963.400733.81730.7593.7056
      WTDA33.65270.84923.901833.03760.83044.2740
      Improved-WDM34.48970.87143.377533.93200.85503.6452
      AWT-PDN36.34600.90462.522635.81480.89222.9423
      5×10-3Oringinal34.52900.83923.883935.49490.85263.6433
      UT36.77870.89692.565337.30570.89682.5696
      Rigrsure34.97100.85343.565736.07250.86953.3022
      Min-max37.00340.90122.466238.22990.91282.1258
      WTDA36.21720.88552.834737.4810.89992.4854
      Improved-WDM37.01770.90182.46338.29550.91412.0905
      AWT-PDN39.16650.93371.789340.06850.93941.8437
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    Xuan Liu, Bingzhen Li, Li Li, Weiqi Jin, Hongchang Cheng. Adaptive Wavelet Threshold Denoising Based on Pixel Dark Noise of EBAPS[J]. Acta Optica Sinica, 2024, 44(16): 1610001

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    Paper Information

    Category: Image Processing

    Received: Mar. 6, 2024

    Accepted: Apr. 29, 2024

    Published Online: Aug. 5, 2024

    The Author Email: Li Li (lili@bit.edu.cn)

    DOI:10.3788/AOS240702

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